2026 ASEE Annual Conference & Exposition papers by Christopher Lowell Romeo
| Title | Session | |
|---|---|---|
| BYOE: Design Rationale behind a Circuit Troubleshooting Laboratory Experiment Through the Lenses of Problem Complexity, Ill-Structuredness, Knowledge Types, and Troubleshooting Process | DELOS Technical Session 6 (BYOE): Circuits, Controls, and Fluid Mechanics Labs | [view paper] |